Skip to main content

Scanning electron probe microanalysis.


Published 1967
SHOW MORE


The combination of electron microprobe x-ray emission spectrometry with the scanning techniques first developed for the scanning electron microscope permits using the scanning electron probe as a microscope sensitive to elemental composition. This techni


Volume NBS Technical Note 278
Year 1967
Pages 50
Possible copyright status NBS/NIST Technical Notes are a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. However, please pay special attention to the individual works to make sure there are no copyright restrictions indicated. Individual works may require securing other permissions from the original copyright holder.
Language English
Call number QC100 .U5753 no.278
Digitizing sponsor NIST Research Library
Book contributor NIST Research Library
Collection NISTTechNotes; NISTresearchlibrary; fedlink; americana
Notes No copyright page found. No table-of-contents pages found.


Reviews

There are no reviews yet. Be the first one to write a review.
PEOPLE ALSO FOUND
NBS/NIST Technical Notes
by Steckler, D. K.; Goldberg, R. N.; Tewari, Y. B.; Buckley, T. J.
16
0
0
NBS/NIST Technical Notes
by Frohnsdorff, Geoffrey; Masters, Larry W.; Martin, Jonathan W.
21
0
0
NBS/NIST Technical Notes
by Gott, Joseph E.; Lowe, Darren L.; Notarianni, Kathy A.; Davis, William.
14
0
0
NBS/NIST Technical Notes
by Chalandon, A.; Schumann, M.; Dechartre, P.; Centre Scientifique et Technique du Bâitment.
30
0
0